Inproceedings
Coupled Simulation to Determine Across Wafer Variations for Electrical and Reliability Parameters of Through-Silicon VIAs Inproceedings
In: Book of Abstracts, 2014, (European Workshop on Materials for Advanced Metallization (MAM), Chemnitz, Germany; 2014-03-02 -- 2014-03-05).
Process and Performance of Copper TSVs Inproceedings
In: Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits, pp. 1–2, 2014, (Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 2014-01-27 -- 2014-01-29).
Modeling the Growth of Thin SnO2 Films using Spray Pyrolysis Deposition Inproceedings
In: Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp. 208–211, 2013, ISBN: 978-1-4673-5733-3, (International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 2013-09-03 -- 2013-09-05).
Modeling Spray Pyrolysis Deposition Inproceedings
In: Proceedings of the World Congress on Engineering (WCE) Vol II, pp. 987–992, 2013, ISBN: 978-988-19252-8-2, (World Congress on Engineering (WCE), London, UK; 2013-07-03 -- 2013-07-05).
Impact of Bosch Scallops Dimensions on Stress of an Open Through Silicon Via Technology Inproceedings
In: Proceedings of the IEEE 14th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EurSimE), 2013, ISBN: 978-1-4673-6137-8, (International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Poland; 2013-04-14 -- 2013-04-17).
Simulations of Local Oxidation Nanolithography by AFM Based on the Generated Electric Field Inproceedings
In: Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp. 189–192, 2012, ISBN: 978-0-615-71756-2, (International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 2012-09-05 -- 2012-09-07).
Electric Field Based Simulations of Local Oxidation Nanolithography using Atomic Force Microscopy in a Level Set Environment Inproceedings
In: ECS Transactions, pp. 265–272, 49, 1, 2012, ISBN: 978-1-56677-990-6, (Intl. Symposium on Microelectronics Technology and Devices (SBMicro), Brasilia, Brazil; 2012-08-30 -- 2012-09-02).
Simulation of Silicon Nanopatterning Using nc-AFM Inproceedings
In: Abstracts 15th International Conference on non-contact Atomic Force Microscopy (nc-AFM), pp. 108, 2012, (International Conference on non-contact Atomic Force Microscopy, Cesky Krumlov; 2012-07-01 -- 2012-07-05).
Towards a Free Open Source Process and Device Simulation Framework Inproceedings
In: Book of Abstracts of the International Workshop on Computational Electronics (IWCE), pp. 141–142, 2012, (International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 2012-05-22 -- 2012-05-25).
A Level Set Simulator for Nanooxidation using Non-Contact Atomic Force Microscopy Inproceedings
In: Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp. 307–310, 2011, ISBN: 978-1-61284-418-3, (International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Osaka, Japan; 2011-09-08 -- 2011-09-10).
A Two-Dimensional Lorentzian Distribution for an Atomic Force Microscopy Simulator Inproceedings
In: Abstracts IMACS Seminar on Monte Carlo Methods (MCM), pp. 30, 2011, (Seminar on Monte Carlo Methods (MCM), Borovets; 2011-08-29 -- 2011-09-02).
A Monte Carlo Simulator for Non-Contact Atomic Force Microscopy Inproceedings
In: Abstracts Intl. Conf. on Large-Scale Scientific Computations, pp. 42–43, 2011, (International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 2011-06-06 -- 2011-06-10).
A Simulator for Local Anodic Oxidation of Silicon Surfaces Inproceedings
In: Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering (CCECE 2011), pp. 695–698, 2011, ISBN: 978-1-4244-9789-8, (IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), Niagara Falls, Canada; 2011-05-08 -- 2011-05-11).
Parallelization Strategy for Hierarchical Run Length Encoded Data Structures Inproceedings
In: Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Networks (PDCN 2011), pp. 131–138, 2011, ISBN: 978-0-88986-864-9, (IASTED International Conference on Parallel and Distributed Computing and Networks (PDCN 2011), Innsbruck; 2011-02-15 -- 2011-02-17).
Three-Dimensional Simulation of Focused Ion Beam Processing Using the Level Set Method Inproceedings
In: Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp. 49–52, 2010, ISBN: 978-1-4244-7700-5, (International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Bologna, Italy; 2010-09-06 -- 2010-09-08).
A 10-bit low-power SAR ADC with a tunable series attenuation capacitor Inproceedings
In: Proceedings of the International Conference on Microelectronics, pp. 399–402, 2008, (International Conference on Microelectronics, Sharjah, United Arab Emirates; 2008-12-14--2008-12-17).
Process Simulation in Micro- and Nano-electronics Inproceedings Forthcoming
In: IWCN - International Workshop on Computational Nanotechnology (2023), Forthcoming, (Invited).
Miscellaneous
Semiconductor Based Integrated Sensors Miscellaneous
Habilitationsschrift, 2020.
PhD Theses
Emulation and Simulation of Microelectronic Fabrication Processes PhD Thesis
Institut für Mikroelektronik, 2022.
Topography Simulation of Novel Processing Techniques PhD Thesis
Institut für Mikroelektronik, 2012.
Unpublished
Process and Device TCAD for Advanced Nano-Electronics Unpublished
2022, (Invited; Seminar of the Institute of Materials in Electrical Engineering 1 at RWTH Aachen, Aachen, Germany; 2022-05-27).
Die Welt der Mikroelektronik Unpublished
2022, (Lange Nacht der Forschung 2022, Wien; 2022-05-20).
Ihr Smartphone - Ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik (mit Virtual Reality) Unpublished
2018, (Lange Nacht der Forschung 2018, Wien; 2018-04-13).
Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik Unpublished
2016, (Lange Nacht der Forschung 2016, Wien; 2016-04-22).